4-20
Measure
Symbol
Two-sample deviation, also called “Allan deviation”
Spectral density of phase deviations
Spectral density of fractional frequency deviations
Phase noise
              * Most frequently found on oscillator specification sheets
sy(t)*
Sf(f)
Sy(f)
L(f)*
        f2Sf(f) = n2Sy(f);  L(f) º ½ [Sf(f)]        (per IEEE Std. 1139),
and
Where t = averaging time, n = carrier frequency, and f = offset or
Fourier frequency, or “frequency from the carrier”.
Short-Term Stability Measures
   IEEE Standard 1139 is the standard for characterizing measurements of frequency, phase, and amplitude instabilities.  The standard measure for characterizing phase and frequency instabilities in the frequency domain is L(f), defined as one half of the double-sideband spectral density of phase fluctuations.  When expressed in decibels, the units of L(f) are dBc/Hz (dB below the carrier in a 1 Hz bandwidth).  A device is to be characterized by a plot of L(f) versus offset frequency f.  In some applications, providing L(f) versus discrete values of offset frequency is sufficient.
   The standard measure for characterizing amplitude instability in the frequency domain is one half of the double-sideband spectral density of the fractional amplitude fluctuations, 1/2 Sa(f). When expressed in decibels, the units of Sa(f) are dBc/Hz.
   In the time domain, the standard measure of frequency and phase instabilities is the fully overlapped Allan deviation y() - see the next few pages.  A device shall be characterized by a plot of y() versus sampling time .  In some cases, providing discrete values of y() versus  is sufficient. The measurement system bandwidth and the total measurement time shall be indicated.

IEEE Standard 1139-1999


Characterization of Clocks and Oscillators, edited by D. B. Sullivan, et al., NIST Technical Note 1337, March 1990.  Time &   Frequency Div., NIST, 325 Broadway, Boulder, CO 80303.

S. R. Stein, "Frequency and Time - Their Measurement and Characterization," in E. A. Gerber and A. Ballato, Precision Frequency Control, Vol. 2, pp. 191-232, Academic Press, 1985