3-29
SEAL
BAKE
PLATE
FINAL
CLEAN
FREQUENCY
ADJUST
CLEAN
INSPECT
BOND
MOUNT
PREPARE
ENCLOSURE
DEPOSIT
CONTACTS
ORIENT
IN MASK
CLEAN
ETCH
(CHEMICAL
POLISH)
CONTOUR
ANGLE
CORRECT
X-RAY
ORIENT
ROUND
LAP
CUT
SWEEP
GROW
QUARTZ
DESIGN
RESONATORS
TEST
OSCILLATOR
Resonator Fabrication Steps
   In the manufacturing of typical quartz resonators, wafers are cut from a quartz crystal bar into plates (“blanks”), along precisely controlled directions with respect to the crystallographic axes.  The cutting is usually done with a slurry saw.  This saw consists of a set of ~100 thin, stretched metal bands moving back and forth across multiple quartz bars in a flood of abrasive slurry. The properties of the resonator depend strongly on the angles of cut (see chapter 4). The angles of cut are determined by x-ray diffraction. After shaping to required dimensions, lapping, etching, (polishing) and cleaning, metal electrodes are applied to the plates which are mounted into holder structures (see “Resonator Packaging” earlier in this chapter). The plates are bonded to the mounting clips of the holder with, e.g., a silver-filled epoxy or polyimide. The assembly, called a crystal unit (or crystal or resonator) is hermetically sealed.
   The above flow chart shows the major steps in the fabrication of a resonator.  Although all the steps can affect the stability, the steps shown in the box are usually the most important with respect to the long term stability of the resonator.  Ideally, these final steps should be performed in an ultrahigh vacuum.  Ultrahigh vacuum baking immediately before hermetic sealing is highly desirable in order to produce low aging, especially if the resonator is exposed to air after frequency adjustment. (See “Aging Mechanisms” in chapter 4.)
   Quartz growing, sweeping and etching/chemical-polishing are discussed in chapter 5.


W.L. Bond, Crystal Technology, John Wiley & Sons, New York, 1976.

J. A. Kusters, “Resonator and Device Technology," in E. A. Gerber and A. Ballato, Precision Frequency Control, Vol. 1, pp.161-183,  Academic Press, 1985.