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The lack of repeatability of the f
vs. T characteristics of oven controlled crystal oscillators (OCXOs),
called "retrace," is illustrated above. Retrace is defined
as the nonrepeatability of the f vs. T characteristic, usually
at the oven temperature of an OCXO, upon on-off cycling under specified
conditions. Retrace is a function of
the storage temperature during the off period.
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The OCXO retrace example above shows that
upon restarting the oscillator after a 14 day off-period, the frequency was
about 7x10-9 lower than what it was just before turn-off, and that
the aging rate had increased significantly upon the restart. About a month elapsed before the
pre-turn-off aging rate was reached again. (Figure shows Df/f in parts in 109
vs. time in days.)
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Retrace limits the accuracies achievable
with OCXOs in applications where the OCXO is on-off cycled. Typical OCXO
retrace specifications, after a 24 hour off period at about 25°C, range from
2 x 10-8 to 1 x 10-9.
Low-temperature storage during the off period, and extending the off
period, often make the retrace worse.
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The causes of hysteresis and retrace are
not well understood. The experimental
evidence to date is inconclusive. The
mechanisms that can cause these effects include strain changes in the
resonator’s mounting structure, changes in the quartz, oscillator circuitry
changes, contamination redistribution in the crystal enclosure, and apparent
hysteresis or retrace due to thermal gradients.
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W. L. Smith, and W.
J. Spencer, "Quartz Crystal Controlled Oscillators," Final Report,
U.S. Army Contract DA36-039 SC-85373, Report No. 25335-H, 15 March 1963,
AD-419717.
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R. A. Sykes, W. L.
Smith, and W. J. Spencer, "Studies on High Precision Resonators,"
Proc. 17th Annual Symposium on Frequency Control, pp. 4-27, 1963,
AD423381. Proc. copies available from
NTIS.
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J. A. Kusters and J.
R. Vig, "Thermal Hysteresis in Quartz Resonators - A Review," Proc.
44th Annual Symposium on Frequency Control, pp. 165-175, 1990, IEEE Catalog
No. 90CH2818-3. This paper is also available at <http://www.ieee.org/uffc/fc>
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